2005 Archived Press Releases

Yantzer Discusses New AGS Cut Grade Parameters at JCK Las Vegas

May 10, 2005- Las Vegas, NV

JCK-Las Vegas Show attendees will have the opportunity to learn the numerous components behind the new American Gem Society (AGS) cut grading system in a free educational session presented by Peter Yantzer, Executive Director of American Gem Society Laboratories on Thursday, June 2, 2005 from 10:30-11:30 AM in the Sands Expo Conference Center. The presentation, "Understanding the New AGS Cut Grading System," will give participants a better understanding of how AGS Lab graders apply cut grades to diamonds, as well as the particular role of certain elements assessed, such as proportion factors.

"A thorough understanding of these parameters, and the metrics that measure them, can help identify which cuts produce the best appearance, and can help retailers increase sales of fine goods," said Yantzer, who recently won the AGS 2005 Robert M. Shipley Award.

The science supporting the new cut grade system reflects AGS' transition from a proportion-based to a performance-based cut grade system, where all facets of a diamond are measured in three dimensions rather than two dimensions. The Lab will use state-of-the-art ray tracing software to trace light traveling through a diamond. The software demonstrates the quantity and quality of the light being returned to the viewer. AGS Laboratories will now consider brightness, dispersion, leakage, contrast, and weight ratio, in addition to proportion, symmetry, and polish, when assigning a final cut grade.

AGS Laboratories recently announced that they will begin issuing DQDs on princess cuts starting May 1, and will issue documents on the round brilliants with the new performance-based system beginning June 1.

marketing@agslab.com.

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